SAM-SPEC® MULTIPOINT NIR SPECTROSCOPY ANALYSIS SYSTEM
UNIQUE PAT SOLUTIONS USING SPATIALLY RESOLVED SPECTROSCOPY WITH MULTIPOINT MEASUREMENT
- Multipoint analysis with up to 27 points measured simultaneously
- Exceptional measurement speed: less than 2 ms
- Dual functionality: testing of physical and chemical properties
- Simultaneous measurement of several parameters including residual moisture, homogeneity, hardness, coating thickness, contaminant detection
- Versatile system adaptable to industrial or laboratory processes
Standard visible and Near InfraRed (NIR) spectroscopy is based on the measurement of a single spectrum per specimen. Spatially Resolved Spectroscopy (SRS) performs measurements simultaneously at different distances from the light source.
SAM-SPEC® NIR system adopts Indatech’s patented technology of Spatially Resolved Spectroscopy (SRS) that performs measurements simultaneously at different distances from the light source, while capable of multipoint measuring of up to 27 measurement points simultaneously. The system has exceptional in-line analysis capacity, handling up to 100 times more volume than traditional approach. With innovative design of combining the powerful hyperspectral imaging (HSI) and NIR-SRS, SAM-SPEC® makes it possible to analyze components both inside and on the surface of the product.
- For tablet and capsule product release, precise and high throughput content uniformity (CU) test of total weight and concentration of the API in tablets and capsules
- Real-time characterization of lyophilized product including in-line quality control for accurate analysis of residual moisture content down to 0.2%
- For liquid and powder in-line blending uniformity analysis with limit of detection to 1%, detection of particle size 200nm to 1,000μm; and turbidity range from 0 to +15,000 NTU
- Real time analysis of powder in the feed frame for API concentration of powder with concentration range from 1% to 100% and high-speed acquisition